A simulation based strategy for mixed-signal testing

A testing strategy that links design with test for mixed-signal devices in order to solve the testing problems at their roots is described. Test generation is achieved through mixed-mode simulation of both analog and digital circuitry on a single chip. The key to this strategy is to incorporate design for testability early in the design phase and to use a special architecture for a mixed-mode simulator that facilitates testing. Simulation environment, rules for analog-digital signal conversion at their interface timing delay, and synchronization are described