• DocumentCode
    1606859
  • Title

    Using high level design models for generation of test vectors

  • Author

    Soboleski, A.

  • Author_Institution
    Hitachi America Ltd., Brisbane, CA
  • fYear
    1992
  • Firstpage
    345
  • Lastpage
    348
  • Abstract
    A description of a method using high-level design simulation that allows the use of functional timing simulations for test vector generation, while observing tester timing requirements is described. This method gives the designer the option of rapidly converting the design verification simulation modules in order to generate test vectors to the timing requirements of the targeted tester
  • Keywords
    automatic testing; logic CAD; logic testing; design verification simulation modules; functional timing simulations; high level design models; test vector generation; tester timing requirements; Artificial intelligence; Clocks; Costs; Delay; Design methodology; Discrete event simulation; Frequency; Production systems; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0768-2
  • Type

    conf

  • DOI
    10.1109/ASIC.1992.270222
  • Filename
    270222