Title :
In situ non contact temperature measurements on PCB during soldering process
Author :
Mashkov, Petko ; Pencheva, Tamara ; Valchev, Angel ; Gyoch, Berkant
Author_Institution :
Phys. Dept., Univ. of Rousse, Rousse, Bulgaria
Abstract :
The paper deals with investigation of non-contact electronic components´ temperature measurements during soldering of surface mounted devices (SMD) to printed circuit boards (PCB). Approach and equipment for non contact temperature measurements with infrared (IR) thermometer is proposed. Measurements of electronic components´ temperature on the PCB are difficult and practically impossible for a lot of electronic components during soldering process. In this paper the results concerning possibility for IR temperature measurements´ application for in situ control of soldering processes are presented. Soldering equipment is based on low inert heaters for the middle IR spectral region without conveyor belt and allows realizing precise measurement and control (in situ) of the temperature on the PCB during the soldering processes, possibility of individual temperature profile for every printed board in dependence of its size, electronic components density and others. Contact temperature measurements (by thermocouples) in a few point on PCB allows controlling the soldering process, but the temperature is measured mostly in one or two points. Application of proposed method and equipment allows to optimize temperature regimes´ control during soldering cycles and to avoid thermal damages of electronic components.
Keywords :
printed circuits; soldering; surface mount technology; temperature measurement; PCB; conveyor belt; infrared thermometer; low inert heaters; middle IR spectral region; non-contact electronic components; printed circuit boards; soldering equipment; soldering process; surface mounted devices; temperature measurements; thermal damages; thermocouples; Belts; Density measurement; Electronic components; Printed circuits; Process control; Size measurement; Soldering equipment; Temperature control; Temperature dependence; Temperature measurement;
Conference_Titel :
Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
Conference_Location :
Budapest
Print_ISBN :
978-1-4244-3972-0
Electronic_ISBN :
978-1-4244-3974-4
DOI :
10.1109/ISSE.2008.5276418