DocumentCode :
1607268
Title :
Wavelet Approach for ECG Baseline Wander Correction and Noise Reduction
Author :
Zhang, Donghui
Author_Institution :
Preclinical & Res. Biostatistics, Bridgewater, NJ
fYear :
2005
fDate :
6/27/1905 12:00:00 AM
Firstpage :
1212
Lastpage :
1215
Abstract :
Electrocardiographic (ECG) analysis plays an important role in safety assessment during new drug development and in clinical diagnosis. The pre-processing of ECG analysis consists of low-frequency baseline wander (BW) correction and high-frequency artifact noise reduction from the raw ECG. We present approaches for BW correction and de-noising based on discrete wavelet transformation (DWT). We estimate the BW via coarse approximation in DWT with recommendations for how to select wavelets and the maximum depth for decomposition level. We reduce the high-frequency noise via empirical Bayes posterior median wavelet shrinkage method with level-dependent and position dependent thresholding values. The methods are applied to a real example. The experimental results indicate that the proposed method can effectively remove both low- and high-frequency noise
Keywords :
Bayes methods; electrocardiography; medical signal processing; signal denoising; wavelet transforms; DWT; ECG; clinical diagnosis; discrete wavelet transformation; drug development; electrocardiographic analysis; empirical Bayes posterior median wavelet shrinkage method; high-frequency artifact noise reduction; level-dependent thresholding values; low-frequency baseline wander correction; position-dependent thresholding values; safety assessment; signal denoising; wavelet approach; Discrete wavelet transforms; Drugs; Electrocardiography; Frequency; Heart rate; Heart rate interval; Heart rate variability; Noise level; Noise reduction; Safety; Discrete Wavelet Transformation; ECG; Empirical Bayes; Wavelet Shrinkage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2005. IEEE-EMBS 2005. 27th Annual International Conference of the
Conference_Location :
Shanghai
Print_ISBN :
0-7803-8741-4
Type :
conf
DOI :
10.1109/IEMBS.2005.1616642
Filename :
1616642
Link To Document :
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