Title :
Hall MHD and PIC modeling of the conduction-to-opening transition in a plasma opening switch
Author :
Schumer, J.W. ; Swandkamp, S.B. ; Ottinger, P.F. ; Commisso, R.J. ; Weber, B.V.
Author_Institution :
Div. of Plasma Phys., Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form only given. By utilizing the fast opening of a plasma opening switch (POS), inductive energy storage devices may generate high power (>1 TW) and short duration (<0.1 /spl mu/s) pulses, ideal for driving intense beam diodes or Z-pinches. The use of 10/sup 15/ to 10/sup 16/ cm/sup -3/ density plasma switches has allowed an extension of the conduction time to above 1 /spl mu/s while still allowing a rapid opening time (few tens of ns). An understanding of the plasma redistribution during the POS conduction phase can be gained with MHD modeling and simulation. However, MHD methods are not valid during the opening and power delivery phases since space-charge separation and kinetic effects are expected to play a key role. If the plasma density at opening is sufficiently low, the opening and power delivery phases can be treated by the particle-in-cell (PIC) method. In this paper we will discuss progress in developing methods to smoothly transition from an MHD treatment of the conduction phase to a PIC treatment of the opening and power delivery phases.
Keywords :
Z pinch; inductive energy storage; plasma density; plasma diodes; plasma magnetohydrodynamics; plasma simulation; plasma switches; Hall MHD modeling; PIC modeling; Z-pinches; conduction time; conduction-to-opening transition; fast opening; inductive energy storage; intense beam diodes; kinetic effects; particle-in-cell method; plasma density; plasma opening switch; plasma redistribution; simulation; space-charge separation; Diodes; Energy storage; Magnetohydrodynamics; Particle beams; Plasma density; Plasma devices; Plasma simulation; Power generation; Pulse generation; Switches;
Conference_Titel :
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location :
Raleigh, NC, USA
Print_ISBN :
0-7803-4792-7
DOI :
10.1109/PLASMA.1998.677552