• DocumentCode
    1607332
  • Title

    Ground bounce, what you simulate may not be what you get

  • Author

    DeFalco, John A.

  • Author_Institution
    Raytheon Co., Andover, MA, USA
  • fYear
    1992
  • Firstpage
    479
  • Lastpage
    482
  • Abstract
    Ground bounce is caused by rapid transitions at the input to the last stage of a CMOS output buffer. The noise is relatively independent of the output edge transition time. The critical noise observation point is the output of a nonswitching gate. More realistic ground bounce simulations can be obtained by observing the output of a nonswitching gate instead of the voltage at the package inductance. Ground bounce is shown to be independent of output risetimes, and nonlinear with the number of outputs switching or the inductance
  • Keywords
    CMOS integrated circuits; circuit analysis computing; digital circuits; CMOS output buffer; ground bounce simulations; noise; nonswitching gate; rapid transitions; Capacitance; Circuit analysis; Circuit simulation; Hardware; Inductance; Inductors; Integrated circuit packaging; Switches; Switching circuits; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0768-2
  • Type

    conf

  • DOI
    10.1109/ASIC.1992.270243
  • Filename
    270243