Title :
Ground bounce, what you simulate may not be what you get
Author :
DeFalco, John A.
Author_Institution :
Raytheon Co., Andover, MA, USA
Abstract :
Ground bounce is caused by rapid transitions at the input to the last stage of a CMOS output buffer. The noise is relatively independent of the output edge transition time. The critical noise observation point is the output of a nonswitching gate. More realistic ground bounce simulations can be obtained by observing the output of a nonswitching gate instead of the voltage at the package inductance. Ground bounce is shown to be independent of output risetimes, and nonlinear with the number of outputs switching or the inductance
Keywords :
CMOS integrated circuits; circuit analysis computing; digital circuits; CMOS output buffer; ground bounce simulations; noise; nonswitching gate; rapid transitions; Capacitance; Circuit analysis; Circuit simulation; Hardware; Inductance; Inductors; Integrated circuit packaging; Switches; Switching circuits; Voltage;
Conference_Titel :
ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0768-2
DOI :
10.1109/ASIC.1992.270243
