DocumentCode
16076
Title
Calibration-Free Electrical Spectrum Analysis for Microwave Characterization of Optical Phase Modulators Using Frequency-Shifted Heterodyning
Author
Shangjian Zhang ; Heng Wang ; Xinhai Zou ; Yali Zhang ; Rongguo Lu ; Yong Liu
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume
6
Issue
4
fYear
2014
fDate
Aug. 2014
Firstpage
1
Lastpage
8
Abstract
A novel calibration-free electrical spectrum analysis method for microwave characterization of electrooptic phase modulators is proposed and experimentally demonstrated based on frequency-shifted optical heterodyning. The method achieves the electrical domain measurement of the modulation efficiency of phase modulators without the need for correcting the responsivity fluctuation in the photodetection. Moreover, it extends double the measuring frequency range through setting a specific frequency relationship between the driving microwave signals. Modulation depth and half-wave voltage of phase modulators are experimentally extracted from the heterodyning spectrum of two phase-modulated signals with and without frequency shifting, and the measured results are compared to those obtained with the traditional optical spectrum analysis method to check the consistency. The proposed method provides calibration-free and accurate measurement for high-speed optical phase modulators with the high-resolution electrical spectrum analysis.
Keywords
electro-optical modulation; heterodyne detection; microwave photonics; optical frequency conversion; phase modulation; calibration-free electrical spectrum analysis; electrical domain measurement; electrooptic phase modulators; frequency-shifted optical heterodyning; half-wave voltage; high-resolution electrical spectrum analysis; microwave characterization; modulation depth; modulation efficiency; optical phase modulators; optical spectrum analysis method; photodetection; responsivity fluctuation; specific frequency relationship; Frequency measurement; Frequency modulation; Optical interferometry; Optical mixing; Optical modulation; Optical variables measurement; Phase modulation; Electro-optical modulation; fiber optics systems; heterodyning; microwave photonics signal processing;
fLanguage
English
Journal_Title
Photonics Journal, IEEE
Publisher
ieee
ISSN
1943-0655
Type
jour
DOI
10.1109/JPHOT.2014.2343991
Filename
6872812
Link To Document