Results of a topologically partitioned parallel automatic test pattern generation system on a distributed-memory multiprocessor

Author

Bell, Robert H. ; Klenke, Robert H. ; Aylor, James H. ; Williams, Ronald D.

Author_Institution

IBM Corp., Burlington, VT, USA

fYear

1992

Firstpage

380

Lastpage

384

Abstract

The design and implementation of an object-oriented topologically partitioned parallel automatic test pattern generation (ATPG) system, ES-TPS, on a multiple-instruction multiple-data (MIMD) distributed-memory multiprocessor are described. The ATPG system is based upon the D-algorithm and performs test generation on a circuit which has been topologically partitioned across several processors. Fault partitioning and algorithmic parallelizations are included in the system to attempt to achieve speedup

Keywords

automatic testing; distributed memory systems; fault location; logic testing; object-oriented methods; parallel algorithms; ATPG; D-algorithm; MIMD; algorithmic parallelizations; distributed-memory multiprocessor; fault partitioning; multiple-instruction multiple-data; object-oriented; parallel automatic test pattern generation system; topologically partitioned; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Digital systems; Distributed power generation; Partitioning algorithms; System testing; Test pattern generators; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-0768-2

Type

conf

DOI

10.1109/ASIC.1992.270264

Filename

270264