DocumentCode
1607966
Title
Predictive reliability and prognostics for electronic components: Current capabilities and future challenges
Author
Bailey, Chris ; Lu, Hua ; Stoyanov, Stoyan ; Yin, Chunyan ; Tilford, Tim ; Ridout, Steve
Author_Institution
Comput. Mech. & Reliability Group, Univ. of Greenwich, London, UK
fYear
2008
Firstpage
67
Lastpage
72
Abstract
Future analysis tools that predict the behavior of electronic components, both during qualification testing and in-service lifetime assessment, will be very important in predicting product reliability and identifying when to undertake maintenance. This paper will discuss some of these techniques and illustrate these with examples. The paper will also discuss future challenges for these techniques.
Keywords
electron device testing; life testing; reliability; electronic components; in-service lifetime assessment; product reliability; qualification testing; Aerospace materials; Electronic components; Electronic equipment testing; Failure analysis; Fatigue; Lead; Maintenance; Physics computing; Product design; Qualifications;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
Conference_Location
Budapest
Print_ISBN
978-1-4244-3972-0
Electronic_ISBN
978-1-4244-3974-4
Type
conf
DOI
10.1109/ISSE.2008.5276460
Filename
5276460
Link To Document