Title :
Predictive reliability and prognostics for electronic components: Current capabilities and future challenges
Author :
Bailey, Chris ; Lu, Hua ; Stoyanov, Stoyan ; Yin, Chunyan ; Tilford, Tim ; Ridout, Steve
Author_Institution :
Comput. Mech. & Reliability Group, Univ. of Greenwich, London, UK
Abstract :
Future analysis tools that predict the behavior of electronic components, both during qualification testing and in-service lifetime assessment, will be very important in predicting product reliability and identifying when to undertake maintenance. This paper will discuss some of these techniques and illustrate these with examples. The paper will also discuss future challenges for these techniques.
Keywords :
electron device testing; life testing; reliability; electronic components; in-service lifetime assessment; product reliability; qualification testing; Aerospace materials; Electronic components; Electronic equipment testing; Failure analysis; Fatigue; Lead; Maintenance; Physics computing; Product design; Qualifications;
Conference_Titel :
Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
Conference_Location :
Budapest
Print_ISBN :
978-1-4244-3972-0
Electronic_ISBN :
978-1-4244-3974-4
DOI :
10.1109/ISSE.2008.5276460