• DocumentCode
    1607966
  • Title

    Predictive reliability and prognostics for electronic components: Current capabilities and future challenges

  • Author

    Bailey, Chris ; Lu, Hua ; Stoyanov, Stoyan ; Yin, Chunyan ; Tilford, Tim ; Ridout, Steve

  • Author_Institution
    Comput. Mech. & Reliability Group, Univ. of Greenwich, London, UK
  • fYear
    2008
  • Firstpage
    67
  • Lastpage
    72
  • Abstract
    Future analysis tools that predict the behavior of electronic components, both during qualification testing and in-service lifetime assessment, will be very important in predicting product reliability and identifying when to undertake maintenance. This paper will discuss some of these techniques and illustrate these with examples. The paper will also discuss future challenges for these techniques.
  • Keywords
    electron device testing; life testing; reliability; electronic components; in-service lifetime assessment; product reliability; qualification testing; Aerospace materials; Electronic components; Electronic equipment testing; Failure analysis; Fatigue; Lead; Maintenance; Physics computing; Product design; Qualifications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
  • Conference_Location
    Budapest
  • Print_ISBN
    978-1-4244-3972-0
  • Electronic_ISBN
    978-1-4244-3974-4
  • Type

    conf

  • DOI
    10.1109/ISSE.2008.5276460
  • Filename
    5276460