DocumentCode
1608002
Title
High-performance microelectronic substrate verification using probe testers
Author
Chou, Nan-Chi ; Cheng, Chung-Kuan ; Russell, Thomas C.
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
fYear
1992
Firstpage
230
Lastpage
233
Abstract
An improved algorithm for high-performance substrate verification utilizing multiprobe testers is proposed. Since there exist numerous test sets for a design the algorithm dynamically selects preferred ones using a linear validation routine during the probe route optimization phase. By considering test generation and probe scheduling simultaneously the superiority of the algorithm is demonstrated
Keywords
automatic test equipment; integrated circuit testing; probes; linear validation routine; microelectronic substrate verification; preferred test sets; probe route optimization; probe scheduling; probe testers; test generation; Capacitance; Electrical resistance measurement; Fault detection; Microelectronics; Probes; Scheduling algorithm; Substrates; Testing; Throughput; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
Conference_Location
Rochester, NY
Print_ISBN
0-7803-0768-2
Type
conf
DOI
10.1109/ASIC.1992.270270
Filename
270270
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