Title :
High-performance microelectronic substrate verification using probe testers
Author :
Chou, Nan-Chi ; Cheng, Chung-Kuan ; Russell, Thomas C.
Author_Institution :
Dept. of Comput. Sci. & Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
An improved algorithm for high-performance substrate verification utilizing multiprobe testers is proposed. Since there exist numerous test sets for a design the algorithm dynamically selects preferred ones using a linear validation routine during the probe route optimization phase. By considering test generation and probe scheduling simultaneously the superiority of the algorithm is demonstrated
Keywords :
automatic test equipment; integrated circuit testing; probes; linear validation routine; microelectronic substrate verification; preferred test sets; probe route optimization; probe scheduling; probe testers; test generation; Capacitance; Electrical resistance measurement; Fault detection; Microelectronics; Probes; Scheduling algorithm; Substrates; Testing; Throughput; Wiring;
Conference_Titel :
ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0768-2
DOI :
10.1109/ASIC.1992.270270
