DocumentCode
160820
Title
Arc flash mitigation through the use of an engineered parallel high speed semi-conductor fuse assembly
Author
Gradwell, Brad
Author_Institution
PACE Eng. Group, Brisbane, QLD, Australia
fYear
2014
fDate
20-23 May 2014
Firstpage
1
Lastpage
14
Abstract
Current-limiting fuses, in their current-limiting range, reduce the available short-circuit current and clear faults in one-half cycle or less significantly limiting the total electrical energy delivered to a fault. If the arc fault current is large enough for a current limiting fuse to be in its current limiting range, the fuse will dramatically reduce the electrical energy delivered to the arc. The use of parallel high speed semi-conductor fuses for low voltage high current applications provides greater limitation than the equivalent fault current limiting fuse rating. The engineered use of parallel high speed semi-conductor fuses can reduce the electrical energy delivered to the arc to a level low enough to obtain an Arc Flash Category 0. The use of parallel high speed semi-conductor fuses in the field requires the use of an engineered assembly. This paper details the development of such an assembly and the difficulties overcome to achieve reliable operations.
Keywords
arcs (electric); assembling; electric fuses; fault current limiters; flashover; semiconductor devices; short-circuit currents; arc fault current limiting fuse rating; arc flash category 0; arc flash mitigation; current-limiting fuses; current-limiting range; electrical energy reduction; engineered parallel high speed semiconductor fuse assembly; high current applications; low applications; short-circuit current; Copper; Fuses; IP networks; Industries; Limiting; Protocols; Standards; Arc flash; IEEE 1584; NFPA 70E; arc flash mitigation personal protective equipment (PPE); arc flash risk management; fault current limiting; parallel fuses; semi-conductor fuses;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial & Commercial Power Systems Tehcnical Conference (I&CPS), 2014 IEEE/IAS 50th
Conference_Location
Fort Worth, TX
Print_ISBN
978-1-4799-3308-2
Type
conf
DOI
10.1109/ICPS.2014.6839162
Filename
6839162
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