An edge detection ASIC for real time defect detection

Author

Robert, M. ; Paindavoine, M. ; Gorria, P.

Author_Institution

CNRS, Montpellier II Univ., France

fYear

1992

Firstpage

193

Lastpage

196

Abstract

The design of a low cost real-time image processing microsystem for detecting defects in manufacturing products is presented. The analysis method is based on an edge detection algorithm (differential operators) to select the information related to the structure of the objects present in the image. The edge calculation function is integrated in a standard cell circuit, using a CMOS 1.5-μm process. The ASIC is implemented and tested in an image processing microsystem with a CCD camera. Results show an improvement of performance in comparison with the first prototypes, allowing the use of this system in an industrial environment for the real-time detection of defects

Keywords

CMOS integrated circuits; application specific integrated circuits; cellular arrays; edge detection; production testing; quality control; television applications; 1.5 micron; CCD camera; CMOS; edge calculation function; edge detection ASIC; edge detection algorithm; industrial environment; manufacturing products; real time defect detection; real-time image processing microsystem; standard cell circuit; Algorithm design and analysis; Application specific integrated circuits; CMOS process; Circuit testing; Costs; Image analysis; Image edge detection; Image processing; Information analysis; Manufacturing processes;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-0768-2

Type

conf

DOI

10.1109/ASIC.1992.270279

Filename

270279