Title :
Mutation analysis with high-level decision diagrams
Author :
Hantson, Hanno ; Raik, Jaan ; Jenihhin, Maksim ; Chepurov, Anton ; Ubar, Raimund ; Guglielmo, Giuseppe Di ; Fummi, Franco
Author_Institution :
Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
Abstract :
The paper presents a new tool for mutation analysis using the system model of high-level decision diagrams (HLDD). The tool is integrated into the APRICOT verification environment. It is based on HLDD simulation and graph perturbation. A strategy that relies on a restricted set of five key mutation operators is developed in order to speed up the mutation analysis. Experiments on several ITC99 benchmarks and an industrial example show the feasibility of the mutation analysis approach.
Keywords :
decision diagrams; hardware description languages; program testing; program verification; APRICOT verification environment; HLDD simulation; graph perturbation; hardware description languages; high-level decision diagrams; mutation analysis approach; system model; Algorithm design and analysis; Analytical models; Benchmark testing; Hardware; Labeling; Software; decision diagrams; mutation analysis;
Conference_Titel :
Test Workshop (LATW), 2010 11th Latin American
Conference_Location :
Pule del Este
Print_ISBN :
978-1-4244-7786-9
Electronic_ISBN :
978-1-4244-7785-2
DOI :
10.1109/LATW.2010.5550336
