• DocumentCode
    1608359
  • Title

    Mutation analysis with high-level decision diagrams

  • Author

    Hantson, Hanno ; Raik, Jaan ; Jenihhin, Maksim ; Chepurov, Anton ; Ubar, Raimund ; Guglielmo, Giuseppe Di ; Fummi, Franco

  • Author_Institution
    Dept. of Comput. Eng., Tallinn Univ. of Technol., Tallinn, Estonia
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The paper presents a new tool for mutation analysis using the system model of high-level decision diagrams (HLDD). The tool is integrated into the APRICOT verification environment. It is based on HLDD simulation and graph perturbation. A strategy that relies on a restricted set of five key mutation operators is developed in order to speed up the mutation analysis. Experiments on several ITC99 benchmarks and an industrial example show the feasibility of the mutation analysis approach.
  • Keywords
    decision diagrams; hardware description languages; program testing; program verification; APRICOT verification environment; HLDD simulation; graph perturbation; hardware description languages; high-level decision diagrams; mutation analysis approach; system model; Algorithm design and analysis; Analytical models; Benchmark testing; Hardware; Labeling; Software; decision diagrams; mutation analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2010 11th Latin American
  • Conference_Location
    Pule del Este
  • Print_ISBN
    978-1-4244-7786-9
  • Electronic_ISBN
    978-1-4244-7785-2
  • Type

    conf

  • DOI
    10.1109/LATW.2010.5550336
  • Filename
    5550336
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1608359