• DocumentCode
    1608486
  • Title

    Potential errors in VDT fringing field measurements

  • Author

    Sapashe, Darren ; Ashley, J. Robert

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
  • fYear
    1991
  • Firstpage
    614
  • Lastpage
    617
  • Abstract
    The authors correct the error of current jargon, including electromagnetic emissions at extra low frequency (ELF), and correctly define the terms needed to describe fringing electric potential gradient and magnetic flux density near any magnetically deflected, raster scan, CRT display. Application of Maxwell´s equations shows that the commonly used pickup coil responds to the derivative of magnetic flux density; furthermore, the electric field pickup transducer also responds to the derivative of electric potential gradient. Both transducers need an integrator to respond properly to the sawtooth waveforms of deflection fields and power supplies. Correct measurements of video display terminal (VDT) fringing magnetic fields are presented. The conclusion from the authors work is that there is not an occupational health risk from the fringing electric or magnetic fields near VDTs
  • Keywords
    biological effects of fields; cathode-ray tube displays; electric field measurement; health hazards; magnetic field measurement; CRT display; Maxwell´s equations; deflection fields; electric field pickup transducer; electromagnetic emissions; extra low frequency; fringing electric potential gradient; integrator; magnetic flux density; magnetically deflected raster scan display; occupational health risk; pickup coil; sawtooth waveforms; video display terminal; Electric potential; Electromagnetic measurements; Error correction; Frequency; Geophysical measurement techniques; Ground penetrating radar; Magnetic field measurement; Magnetic flux; Magnetic flux density; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1991. IMTC-91. Conference Record., 8th IEEE
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-87942-579-2
  • Type

    conf

  • DOI
    10.1109/IMTC.1991.161669
  • Filename
    161669