Title :
Comprehensive structural testing of ASIC macrocells, a comparative analysis
Author :
Sucar, Hector R.
Author_Institution :
CrossCheck Technol. Inc., San Jose, CA, USA
Abstract :
A comparative analysis of three test generation methods for designs based on CMOS ASIC macrocells is presented. These methods are (1) stuck-at tests, (2) IDDQ tests; and (3) crosscheck tests. The fault modeling technique for each method is described. The test generated by using the fault model of each method is used to compare the completeness of the methods in terms of actual defect coverage. Conclusions are derived for each method according to its effectiveness for achieving desired quality levels
Keywords :
application specific integrated circuits; cellular arrays; fault location; integrated circuit testing; logic arrays; logic testing; ASIC macrocells; CMOS; IDDQ tests; crosscheck tests; defect coverage; fault modeling technique; quality levels; structural testing; stuck-at tests; test generation methods; Application specific integrated circuits; CMOS technology; Circuit faults; Circuit testing; Current measurement; Integrated circuit testing; Macrocell networks; Manufacturing; Observability; Semiconductor device modeling;
Conference_Titel :
ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0768-2
DOI :
10.1109/ASIC.1992.270290
