• DocumentCode
    1608563
  • Title

    An algorithm for diagnostic fault simulation

  • Author

    Zhang, Yu ; Agrawal, Vishwani D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In diagnostic testing faults detectable by test vectors are partitioned into groups. This partitioning is such that a fault is distinguishable from faults in all other groups, but is indistinguishable from those in its own group. Diagnostic fault coverage (DC) is defined as the number of fault groups divided by the total number of faults. We present a new diagnostic fault simulation algorithm that determines the DC of given test vectors and produces a fault dictionary. For each vector, we begin with detected fault list at each primary output obtained from a convetional fault simulator. For the vector being simulated each fault is assigned a detection index that uniquely specifies its detection status at all primary outputs. Fault list is then partitioned. Faults with different detection index are distinguished by the simulated vector and are kept in separate groups. Any fault in a group by itself is dropped from further simulation with subsequent vectors for which its detection index remains unknown (X). After simulation of each vector, the cumulative DC is obtained by counting the fault groups. Fault dictionary syndrome for a fault is the array of its detection indexes.
  • Keywords
    automatic test pattern generation; fault simulation; detection index; diagnostic fault coverage; diagnostic fault simulation; fault dictionary syndrome; fault groups; fault list; test vectors; Circuit faults; Computational modeling; Dictionaries; Fault diagnosis; Indexes; Integrated circuit modeling; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2010 11th Latin American
  • Conference_Location
    Pule del Este
  • Print_ISBN
    978-1-4244-7786-9
  • Electronic_ISBN
    978-1-4244-7785-2
  • Type

    conf

  • DOI
    10.1109/LATW.2010.5550345
  • Filename
    5550345