DocumentCode :
1608623
Title :
Molecular dynamics and electrical simulation of a novel GaN/4H-SiC hetero-structure optically triggered vertical NPN device
Author :
Bose, Srikanta ; Mazumder, Sudip K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
fYear :
2010
Firstpage :
139
Lastpage :
142
Abstract :
In this paper, an atomistic molecular dynamics followed by an electrical simulation study is made to study the turn-on and turn-off characteristics, gain, and breakdown voltage of an optically triggered GaN/4H-SiC hetero-structure vertical NPN device with 1 nm AlN as the buffer layer and the results are compared with the optically triggered all-4H-SiC NPN device. The optically triggered GaN/4H-SiC hetero-structure provides better switching characteristics, however, the breakdown strength of all-4H-SiC NPN device shows better results than GaN/4H-SiC device because of high critical field strength of 4H-SiC material.
Keywords :
III-V semiconductors; electric breakdown; gallium compounds; molecular dynamics method; phototransistors; silicon compounds; wide band gap semiconductors; GaN-SiC; atomistic molecular dynamics; breakdown strength; buffer layer; electrical simulation; heterostructure optically triggered vertical NPN device; Atom optics; Atomic layer deposition; Gallium nitride; Materials; Optical buffering; Optical devices; Optical pulses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices & Microsystems (ASDAM), 2010 8th International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4244-8574-1
Type :
conf
DOI :
10.1109/ASDAM.2010.5666324
Filename :
5666324
Link To Document :
بازگشت