Manufacturers to end-users tools for radiations induced reliability issues in electronic devices

Natural radiations induced failures in microelectronics has first been a real concern for space and avionic communities. Due to device integration this is now an issue for all commercial applications even at ground level. As an example, single event transients and soft errors are an actual concern. Natural radioactivity also contributes to this issue, especially at ground and underground levels. Simulation tools are very useful to establish the transient current shapes and to evaluate the soft error rate. This kind of code can be validated thanks to accelerated tests under beam and/or accelerated test in natural environment (i.e. in altitude).