DocumentCode
1608985
Title
Role of interface on structure and properties of epitaxial ferroelectric thin films
Author
Pan, Xiaoqing
Author_Institution
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, 48109, USA
Volume
1
fYear
2008
Firstpage
1
Lastpage
1
Abstract
It has been recently reported that epitaxial strain can elevate ferroelectric transition temperature (Tc) by hundreds of degrees in both BaTiO3 and SrTiO3 thin films and produce room-temperature ferroelectricity in SrTiO3, a material that normally is not ferroelectric at any temperature. HRTEM analysis of strained BaTiO3 predicts the enhancement of spontaneous polarization by more than 100%, which is consistent with the direct measurements of strained BaTiO3 thin films using epitaxial SrRuO3 electrodes. Furthermore, ultraviolet Raman spectroscopy studies showed that one-unit-cell-thick BaTiO3 layers in BaTiO3/SrTiO3 superlattices are not only ferroelectric (with Tc as high as 250 K) but also polarize the quantum paraelectric SrTiO3 layers adjacent to them. The ferroelectric transition temperature was tuned by ~500 ??C by varying the thicknesses of the BaTiO3 and SrTiO3 layers, revealing the essential roles of electrical and mechanical boundary conditions for nanoscale ferroelectricity. This talk will focus on the structure-property relationships of interfaces in such epitaxial ferroelectric thin films and superlattices. The effect of lattice mismatch (epitaxial strain), crystal defects, and chemistry at the film/substrate interfaces on the microstructure and physical properties of different systems will be addressed.
Keywords
Boundary conditions; Capacitive sensors; Electrodes; Ferroelectric materials; Polarization; Raman scattering; Spectroscopy; Superlattices; Temperature; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location
Santa Re, NM, USA
ISSN
1099-4734
Print_ISBN
978-1-4244-2744-4
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2008.4693926
Filename
4693926
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