• DocumentCode
    1609010
  • Title

    Automated test-bed for analog to digital converters

  • Author

    Lima, José Erick de Souza ; Filho, Carlos A dos Reis

  • Author_Institution
    Sci., Technol. & Innovation Center for the Ind. of Manaus, CT-PIM, Manaus, Brazil
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    An automated test-bed for Analog to Digital Converters is described, which is based upon an arrangement of equipments controlled by LabView to implement standard-based procedures that provide accurate values of the most relevant metrics of an ADC. The targeted metrics that the system has been conceived to provide are SNR, SINAD, ENOB, Worst Harmonic and SFDR. In essence, the developed system differs from previously reported similar solutions in that it is not restricted to characterize only ADC´s that operate at a specific range of conversion rate, neither was it developed to serve as a pass/no-pass testing base for production lines. Instead, it is uncommitted with either the type or speed of the ADC under test, thanks to its hardware modularity and incorporation of test routines for both slow and fast ADC´s. Moreover, it provides a wider range of information about the device under test, since it has been conceived as a tool to support designers in the development of ADC´s. Experimental testing results performed for the validation of the test-bed are presented and discussed.
  • Keywords
    analogue-digital conversion; integrated circuit testing; ENOB; LabView; SFDR; SINAD; SNR; analog to digital converters; automated test-bed; device under test; no-pass testing; production lines; worst harmonic; Analog-digital conversion; Discrete Fourier transforms; Frequency domain analysis; Noise; Software; Testing; ADC test-bed; Analog to Digital Converters; LabView;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2010 11th Latin American
  • Conference_Location
    Pule del Este
  • Print_ISBN
    978-1-4244-7786-9
  • Electronic_ISBN
    978-1-4244-7785-2
  • Type

    conf

  • DOI
    10.1109/LATW.2010.5550359
  • Filename
    5550359