DocumentCode
1609010
Title
Automated test-bed for analog to digital converters
Author
Lima, José Erick de Souza ; Filho, Carlos A dos Reis
Author_Institution
Sci., Technol. & Innovation Center for the Ind. of Manaus, CT-PIM, Manaus, Brazil
fYear
2010
Firstpage
1
Lastpage
5
Abstract
An automated test-bed for Analog to Digital Converters is described, which is based upon an arrangement of equipments controlled by LabView to implement standard-based procedures that provide accurate values of the most relevant metrics of an ADC. The targeted metrics that the system has been conceived to provide are SNR, SINAD, ENOB, Worst Harmonic and SFDR. In essence, the developed system differs from previously reported similar solutions in that it is not restricted to characterize only ADC´s that operate at a specific range of conversion rate, neither was it developed to serve as a pass/no-pass testing base for production lines. Instead, it is uncommitted with either the type or speed of the ADC under test, thanks to its hardware modularity and incorporation of test routines for both slow and fast ADC´s. Moreover, it provides a wider range of information about the device under test, since it has been conceived as a tool to support designers in the development of ADC´s. Experimental testing results performed for the validation of the test-bed are presented and discussed.
Keywords
analogue-digital conversion; integrated circuit testing; ENOB; LabView; SFDR; SINAD; SNR; analog to digital converters; automated test-bed; device under test; no-pass testing; production lines; worst harmonic; Analog-digital conversion; Discrete Fourier transforms; Frequency domain analysis; Noise; Software; Testing; ADC test-bed; Analog to Digital Converters; LabView;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop (LATW), 2010 11th Latin American
Conference_Location
Pule del Este
Print_ISBN
978-1-4244-7786-9
Electronic_ISBN
978-1-4244-7785-2
Type
conf
DOI
10.1109/LATW.2010.5550359
Filename
5550359
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