Author :
Han, Y. ; Reaney, I.M. ; Johnson, R. ; Telli, M.B. ; Tinberg, D.S. ; Levin, I. ; Trolier-McKinstry, S.
Author_Institution :
Department of Engineering Materials, University of Sheffield, Sir Robert Hadfield Building, Mappin Street, S1 3JD, United Kingdom
Abstract :
Epitaxial AgTa0.5Nb0.5O3 (ATN) films deposited on (001)p SrRuO3/LaAlO3 and LaAlO3 by a chemical solution deposition technique have been characterised by transmission electron microscopy. The structure of the ATN layers has been compared with equivalent bulk ceramics. For thin ATN films, only superstructure reflections at ??{ooo} positions were observed, consistent with a structure tilted in antiphase only. In contrast, bulk ATN showed ????(00l) reflections which result from a combination of in-phase and antiphase tilting along the c axis as well as antiparallel cation displacements.
Keywords :
Diffraction; Films; Materials; Niobium; Reflection; Substrates; Superlattices;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4693931
