Electrical Impedance Tomography Based on Sensitivity Theorem with Singular Value Decomposition

In electrical impedance tomography (EIT), distribution of internal resistivity of an unknown object is estimated using measured boundary voltage induced by different current patterns. In this paper singular value decomposition is modified with a threshold to be used in the sensitivity theorem for reconstruction of EIT images. Two different parameters are added to the singular values according to a threshold. The method has a major impact on efficient solution of EIT to achieve improved image resolution. Computer simulation and experiments indicate that this method performs better than the previous truncated SVD without using the threshold in terms of reconstructed image resolution