DocumentCode :
1609339
Title :
Applications of approximate wave analysis to ultrasonic flaw imaging
Author :
Hirose, S.
Author_Institution :
Dept. of Mech. & Environ. Inf., Tokyo Inst. of Technol., Tokyo, Japan
fYear :
2013
Firstpage :
8
Lastpage :
11
Abstract :
Two applications of approximate wave analyses to ultrasonic flaw imaging are presented. One is to apply a high frequency approximation for transmitted waves through curved interfaces to improve SAFT images of flaws in a structure with complex geometry. As examples, the improved SAFT is applied to pitch-catch data for flaws in an immersed round bar, and flaw images are compared with conventional SAFT images. Another application is to use a low frequency approximation to reconstruct a flaw shape of 3-D plate thinning from reflection coefficients of ultrasonic guided waves. By introducing a far field expression of Green´s functions and Born approximation into the integral expression, a Fourier transform pair is obtained between the shape function of thinning flaw and reflection coefficients of backscattered guided waves. Some numerical examples are illustrated to show the validity and effectiveness of our inverse approach.
Keywords :
Fourier transforms; Green´s function methods; bars; integral equations; plates (structures); ultrasonic imaging; ultrasonic materials testing; ultrasonic reflection; ultrasonic transmission; 3D plate thinning; Born approximation; Fourier transform pair; Green functions; SAFT flaw images; approximate wave analysis; complex geometry; conventional SAFT images; curved interfaces; far field expression; flaw shape reconstruction; high frequency approximation; immersed round bar; integral expression; low frequency approximation; pitch-catch data; transmitted ultrasonic waves; ultrasonic flaw imaging; ultrasonic guided wave reflection coefficients; Acoustics; Approximation methods; Image reconstruction; Imaging; Shape; Solids; Surface waves; Born & far field approximations; Kirchhoff approximation; SAFT; curved interface; guided wave;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nondestructive Evaluation/Testing: New Technology & Application (FENDT), 2013 Far East Forum on
Conference_Location :
Jinan
Print_ISBN :
978-1-4673-6018-0
Type :
conf
DOI :
10.1109/FENDT.2013.6635519
Filename :
6635519
Link To Document :
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