• DocumentCode
    1609402
  • Title

    Rigorous mathematical calculation of p- and n-mobility as functions of mechanical stress, electric field, current direction and substrate indices for scaled CMOS designing

  • Author

    Okada, Takako ; Yoshimura, Hisao

  • Author_Institution
    Corp. Res. Dev. Center, Toshiba Corp., Kawasaki, Japan
  • fYear
    2004
  • Firstpage
    116
  • Lastpage
    117
  • Abstract
    For quantitative understanding of mobility, scattering rate and effective mass in an anisotropic system of strained/unstrained silicon and germanium, we have developed a rigorous physical equation of Schrodinger base wave functions. Using the tool, we have first quantitatively demonstrated p- and n-mobility characteristics as functions of mechanical stress, electric field, current direction and substrate indices.
  • Keywords
    CMOS integrated circuits; Schrodinger equation; carrier mobility; integrated circuit design; stress effects; Schrodinger base wave functions; current direction; electric field; mathematical calculation; mechanical stress; n-mobility; p-mobility; scaled CMOS designing; substrate indices; Acoustic scattering; Anisotropic magnetoresistance; Capacitive sensors; Effective mass; Equations; Germanium; Silicon; Substrates; Tensile stress; Wave functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on
  • Print_ISBN
    0-7803-8289-7
  • Type

    conf

  • DOI
    10.1109/VLSIT.2004.1345426
  • Filename
    1345426