DocumentCode
1609402
Title
Rigorous mathematical calculation of p- and n-mobility as functions of mechanical stress, electric field, current direction and substrate indices for scaled CMOS designing
Author
Okada, Takako ; Yoshimura, Hisao
Author_Institution
Corp. Res. Dev. Center, Toshiba Corp., Kawasaki, Japan
fYear
2004
Firstpage
116
Lastpage
117
Abstract
For quantitative understanding of mobility, scattering rate and effective mass in an anisotropic system of strained/unstrained silicon and germanium, we have developed a rigorous physical equation of Schrodinger base wave functions. Using the tool, we have first quantitatively demonstrated p- and n-mobility characteristics as functions of mechanical stress, electric field, current direction and substrate indices.
Keywords
CMOS integrated circuits; Schrodinger equation; carrier mobility; integrated circuit design; stress effects; Schrodinger base wave functions; current direction; electric field; mathematical calculation; mechanical stress; n-mobility; p-mobility; scaled CMOS designing; substrate indices; Acoustic scattering; Anisotropic magnetoresistance; Capacitive sensors; Effective mass; Equations; Germanium; Silicon; Substrates; Tensile stress; Wave functions;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN
0-7803-8289-7
Type
conf
DOI
10.1109/VLSIT.2004.1345426
Filename
1345426
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