• DocumentCode
    1609660
  • Title

    Atomic beam source for ion diode diagnostics

  • Author

    Knyazev, B.A. ; An, W. ; Bluhm, H. ; Buth, L.

  • Author_Institution
    Novosibirsk State Univ., Russia
  • Volume
    1
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    471
  • Abstract
    The quality of beams generated with high power electron and ion diodes sensitively depends on processes in the diode acceleration gap. Although passive spectroscopy allows us to study many of the details of light-ion diodes, ions suitable for spectroscopy are often not present in sufficient quantities inside the gap. Active spectroscopy based on local laser resonance excitation of an atomic beam injected into the diode has already been successfully applied in electron diodes and may also be used as a diagnostic tool in ion diodes. To study an ion diode, we suggest injecting a Li atomic probe beam as a diagnostic, using active Stark spectroscopy
  • Keywords
    Stark effect; atomic beams; diodes; particle beam diagnostics; Li; Li atomic beam; active Stark spectroscopy; atomic beam source; diagnostics; diode acceleration gap; ion diode; laser resonance excitation; Acceleration; Atom lasers; Atomic beams; Diodes; Electron beams; Laser excitation; Particle beams; Power generation; Resonance; Spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Power Particle Beams, 1998. BEAMS '98. Proceedings of the 12th International Conference on
  • Conference_Location
    Haifa
  • Print_ISBN
    0-7803-4287-9
  • Type

    conf

  • DOI
    10.1109/BEAMS.1998.822481
  • Filename
    822481