DocumentCode
1609660
Title
Atomic beam source for ion diode diagnostics
Author
Knyazev, B.A. ; An, W. ; Bluhm, H. ; Buth, L.
Author_Institution
Novosibirsk State Univ., Russia
Volume
1
fYear
1998
fDate
6/20/1905 12:00:00 AM
Firstpage
471
Abstract
The quality of beams generated with high power electron and ion diodes sensitively depends on processes in the diode acceleration gap. Although passive spectroscopy allows us to study many of the details of light-ion diodes, ions suitable for spectroscopy are often not present in sufficient quantities inside the gap. Active spectroscopy based on local laser resonance excitation of an atomic beam injected into the diode has already been successfully applied in electron diodes and may also be used as a diagnostic tool in ion diodes. To study an ion diode, we suggest injecting a Li atomic probe beam as a diagnostic, using active Stark spectroscopy
Keywords
Stark effect; atomic beams; diodes; particle beam diagnostics; Li; Li atomic beam; active Stark spectroscopy; atomic beam source; diagnostics; diode acceleration gap; ion diode; laser resonance excitation; Acceleration; Atom lasers; Atomic beams; Diodes; Electron beams; Laser excitation; Particle beams; Power generation; Resonance; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Power Particle Beams, 1998. BEAMS '98. Proceedings of the 12th International Conference on
Conference_Location
Haifa
Print_ISBN
0-7803-4287-9
Type
conf
DOI
10.1109/BEAMS.1998.822481
Filename
822481
Link To Document