Title :
Time delay estimation via third-order cumulant
Author :
Shiyuan Zhou ; Yao Xu ; Hongbo Wang ; Chunguang Xu
Author_Institution :
Key Lab. of Fundamental Sci. for Adv. Machining, Beijing Inst. of Technol., Beijing, China
Abstract :
Time-delay is a very significant measurement in the field of non-destructive test. The accuracy of time-delay estimation (TDE) directly influences the precision and reliability of the relative measurement method used in non-destructive testing, such as leak location in underground pipeline leak test, ultrasonic blood velocity measurement, ultrasonic material stress measurement etc. In this paper, methods based on third-order cumulant are applied, including Cross Third-order Cumulant Method and Bispectrum Method, to ultrasonic time delay estimation. Higher-order cumulant can effectively suppress big noise interference. According to the principle that the third moment sequence of a zero-mean Gaussian process is identical to zero, we can use third-order cumulant to estimate time delay. Comparing with Generalized Cross-correlation Method, these methods can suppress the effect of correlated Gaussian noise sources and can be used as the substitution of Generalized Cross-correlation Method.
Keywords :
Gaussian noise; acoustic signal processing; higher order statistics; nondestructive testing; ultrasonic velocity measurement; TDE; big noise interference; bispectrum method; correlated Gaussian noise sources; generalized cross-correlation method; higher-order cumulant; nondestructive testing; relative measurement method; third moment sequence; third-order cumulant method; ultrasonic blood velocity measurement; ultrasonic material stress measurement; ultrasonic time delay estimation; underground pipeline leak test; zero-mean Gaussian process; Acoustics; Correlation; Delay effects; Estimation; Gaussian noise; Signal to noise ratio; bispectrum method; cross-correlation; third-order cumulant; time-delay estimation;
Conference_Titel :
Nondestructive Evaluation/Testing: New Technology & Application (FENDT), 2013 Far East Forum on
Conference_Location :
Jinan
Print_ISBN :
978-1-4673-6018-0
DOI :
10.1109/FENDT.2013.6635533