• DocumentCode
    1609812
  • Title

    Single channel blind source separation for defect identification using Eddy Current Pulsed Thermography

  • Author

    Bin Gao ; Libing Bai ; Woo, Wai L. ; Gui Yun Tian ; Yuhua Cheng

  • Author_Institution
    Sch. of Autom., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2013
  • Firstpage
    97
  • Lastpage
    101
  • Abstract
    A single channel blind source separation is proposed to process the Eddy Current Pulsed Thermography (ECPT) image sequences. The proposed method enables the detection automatically extract valuable spatial and time patterns according to the whole transient response behavior without any training knowledge. In addition, it has the potential to automatically identify defect patterns and quantify the defects. In this study, both mathematical and physical models are discussed and linked. The basis of the selection of separated spatial and time patterns is also presented. In addition, a natural crack is applied to validate the proposed method.
  • Keywords
    blind source separation; computerised instrumentation; crack detection; eddy currents; electric sensing devices; image sequences; infrared imaging; mathematical analysis; ECPT; crack; defect identification; eddy current pulsed thermography image sequence; mathematical model; physical model; single channel blind source separation; spatial pattern extraction; time pattern extraction; transient response behavior; Blind source separation; Coils; Eddy currents; Fatigue; Heating; Principal component analysis; Vectors; Eddy Current Pulsed Thermography; Non-destructive evaluation; Pattern extraction; single channel blind source separation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nondestructive Evaluation/Testing: New Technology & Application (FENDT), 2013 Far East Forum on
  • Conference_Location
    Jinan
  • Print_ISBN
    978-1-4673-6018-0
  • Type

    conf

  • DOI
    10.1109/FENDT.2013.6635536
  • Filename
    6635536