• DocumentCode
    1609830
  • Title

    Ferroelectric SPICE model, testing and fitting

  • Author

    Summerfelt, Scott R. ; Rodriguez, John R. ; McAdams, Hugh P.

  • Author_Institution
    Analog Technology Development, Texas Instruments Inc., Dallas, USA
  • Volume
    1
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Design of ferroelectric memories, F-RAMs, requires an accurate ferroelectric SPICE model. The goal of a good SPICE model is to predict the behavior of the ferroelectric capacitor in the circuit environment.
  • Keywords
    Capacitors; Circuit testing; Ferroelectric materials; Instruments; Mathematical model; Paper technology; Random access memory; SPICE; Ultrasonics, ferroelectrics, and frequency control; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693963
  • Filename
    4693963
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1609830