Title :
Extraction of embedded dispersion characteristics
Author :
Eberspächer, Mark A. ; Eibert, Thomas F.
Author_Institution :
Lehrstuhl fur Hochfrequenztech., Tech. Univ. Munchen, Munich, Germany
Abstract :
A de-embedding method is presented which allows to extract the dispersion characteristics of embedded periodic waveguiding structures. It is shown that the only required reference standard is a Thru dummy. Except symmetry, no further requirements on the dummy are requested. Particularly, the Thru does not need to possess a certain network topology, like T or π-shaped network. Furthermore, no equivalent circuit needs to be assumed. By adding an additional Line standard S-parameters may also be determined.
Keywords :
network topology; waveguide theory; π-shaped network; Thru dummy; embedded dispersion characteristic extraction; embedded periodic waveguiding structures; equivalent circuit; line standard S-parameters; network topology; Dispersion; metamaterials; parameter extraction; periodic structures; propagation constant;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4577-2034-5