DocumentCode :
161023
Title :
Efficient heterogeneous face recognition using Scale Invariant Feature Transform
Author :
Purandare, Vrushali ; Talele, K.T.
Author_Institution :
Dept. of Electron. & Telecommun., Watumull Inst. of Electron. & Comput. Technol., Mumbai, India
fYear :
2014
fDate :
4-5 April 2014
Firstpage :
305
Lastpage :
310
Abstract :
Face recognition includes analysis of an image and extracting its facial features which will help to discriminate it from others. Scale invariant feature transform (SIFT) to extract distinctive invariant features from images can be used to perform reliable matching. The features extracted are invariant to rotation, image scale and illumination. Systematic investigation of face recognition using SIFT features has been done. Being high distinctive features, every feature can be matched correctly with high probability against a huge database of features from many images. Result shows that SIFT is flexible recognition algorithm as compared to Contour matching algorithm for heterogeneous images. Both the algorithms are experimentally evaluated on AT&T, YALE and IIT-KANPUR databases with moderate subject size. Though Contour matching provides computational simplicity, SIFT provides efficient face recognition technique under pose, expression and varying illumination condition. Experimentally it confirms that Contour matching outperforms when the database is small but for large databases Scale Invariant Feature Transform (SIFT) gives more than 90% recognition rate.
Keywords :
face recognition; feature extraction; image matching; lighting; transforms; visual databases; AT&T databases; IIT-KANPUR databases; SIFT features; YALE databases; contour matching algorithm; distinctive invariant feature extraction; facial feature extraction; feature matching; flexible recognition algorithm; heterogeneous face recognition; image analysis; scale invariant feature transform; varying illumination condition; Arrays; Databases; Face; Face recognition; Feature extraction; Principal component analysis; Training; Contour matching; scale invariant feature transform(SIFT);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits, Systems, Communication and Information Technology Applications (CSCITA), 2014 International Conference on
Conference_Location :
Mumbai
Type :
conf
DOI :
10.1109/CSCITA.2014.6839277
Filename :
6839277
Link To Document :
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