• DocumentCode
    1610311
  • Title

    Staged tests increase awareness of arc-flash hazards in electrical equipment

  • Author

    Jones, Ray A. ; Liggett, Danny P. ; Capelli-schellpfeffer, Mary ; Macalady, Terry ; Saunders, Lynn F. ; Downey, Robert E. ; McClung, L. Bruce ; Smith, Arthur ; Jamil, Shahid ; Saporita, Vincent J.

  • Author_Institution
    DuPont Eng., Wilmington, DE, USA
  • fYear
    1997
  • Firstpage
    313
  • Lastpage
    322
  • Abstract
    The cause and prevention of electrical arcs have been explored since the early 1960s. Engineering design, construction of equipment enclosure, modifications with structural protections and, more recently, requirements for employee safe work practices have all targeted the risks of electrical arc hazards. Yet arcs accompanied by explosions continue to occur in electrical systems. Both human factors and equipment malfunctions contribute to the unexpected release of explosive electrical energy in the workplace. This paper presents experimental results of staged tests simulating the participation of workers in the test scene. Observations regarding the intensities of electrical arc flash events, variances between predicted and observed measurements and implications for safety management are discussed. The intent is to improve the understanding of how people are exposed to electrical hazards in industrial settings so that prevention strategies may be enhanced
  • Keywords
    arcs (electric); electric ignition; industrial power systems; management; power apparatus; safety; testing; arc-flash hazards; electrical arc hazards; electrical equipment; employee safety; equipment malfunctions; human factors; industrial electrical systems; safe work practices; safety management; Design engineering; Electric variables measurement; Employment; Explosions; Explosives; Hazards; Human factors; Layout; Protection; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Petroleum and Chemical Industry Conference, 1997. Record of Conference Papers. The Institute of Electrical and Electronics Engineers Incorporated Industry Applications Society 44th Annual
  • Conference_Location
    Banff, Alta.
  • ISSN
    0090-3507
  • Print_ISBN
    0-7803-4217-8
  • Type

    conf

  • DOI
    10.1109/PCICON.1997.648198
  • Filename
    648198