Title :
An Admission Control Strategy for Soft Frequency Reuse Deployment of LTE Systems
Author :
Lu, Zhaoxin ; Tian, Hui ; Sun, Qiaoyun ; Huang, Bo ; Zheng, Shuqin
Author_Institution :
Key Lab. of Universal Wireless Commun., Beijing Univ. of Posts & Telecommun., Beijing, China
Abstract :
For UTRAN Long Term Evolution (LTE) systems, inter-cell interference is the most important interference source. Inter-cell interference coordination (IOC) is considered to improve coverage and increase data rate at cell edge. The current consensus of IOC scheme is towards semi-static soft frequency reuse (SFR). Due to the limitation of resource configuration way for semi-statci SFR, problems will be met when applying the traditional admission control strategy to semi-static SFR deployment. In this paper, we have investigated the joint design of SFR and the corresponding call admission control strategy. A scheme is proposed which affords a new resource configuration strategy for SFR and an admission control algorithm which takes full account of the frequency planning of SFR and makes coordination among different cell zones or neighboring cells. Simulation results show that the proposed scheme can achieve good performance in terms of blocking probability, handover outage and resource utilization.
Keywords :
3G mobile communication; radiofrequency interference; telecommunication congestion control; telecommunication network planning; LTE systems; admission control strategy; intercell interference coordination; resource configuration; resource configuration strategy; resource utilization; semistatic soft frequency reuse; soft frequency reuse deployment; Admission control; Call admission control; Communications Society; Frequency; Interference; Long Term Evolution; Resource management; Signal to noise ratio; Strategic planning; Telecommunication traffic;
Conference_Titel :
Consumer Communications and Networking Conference (CCNC), 2010 7th IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-5175-3
Electronic_ISBN :
978-1-4244-5176-0
DOI :
10.1109/CCNC.2010.5421841