Title :
Characterization of switched reluctance machines using Fourier series approach
Author :
Andrade, D.A. ; Krishnan, R.
Author_Institution :
Sch. of Electr. Eng., Uberlandia Univ., Brazil
Abstract :
This paper presents a new method for the analytical representation of the phase inductance of a switched reluctance machine (SRM), as a function of position and current, taking into account the nonlinearity of the magnetic circuit. It is based on Fourier series expansion with step-by-step current dependent adjustable coefficients. Analytical expressions for the calculation of instantaneous phase inductance, flux linkage, coenergy and electromagnetic torque as functions of rotor position and winding currents are derived. To evaluate the accuracy of the proposed approach, the current-position dependent inductance profile and static torque curves are compared to experimentally correlated finite element analysis results, of two prototype switched reluctance motors: a rotating and a linear motor. The outcome is a mathematically elegant technique, able to characterize a given machine with a very good degree of accuracy, as confirmed by the compared results.
Keywords :
Fourier series; finite element analysis; inductance; linear motors; machine theory; magnetic circuits; reluctance motors; rotors; torque; Fourier series approach; Fourier series expansion; SRM; coenergy; current-position dependent inductance profile; electromagnetic torque; finite element analysis; flux linkage; instantaneous phase inductance; linear motor; magnetic circuit nonlinearity; rotating motor; rotor position; static torque curves; step-by-step current dependent adjustable coefficients; switched reluctance machines characterisation; switched reluctance motors; winding currents; Electromagnetic analysis; Fourier series; Inductance; Magnetic analysis; Magnetic circuits; Magnetic switching; Reluctance machines; Reluctance motors; Switching circuits; Torque;
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-7114-3
DOI :
10.1109/IAS.2001.955391