Title :
Proceedings of the Fifth Asian Test Symposium (ATS´96)
Abstract :
The following topics were dealt with: test pattern generation; board-level test; system-level test; design for testability; concurrent error detection; fault tolerance; synthesis for testability; IDDQ modelling; BIST; circuit-level diagnostics; system-level diagnostics; and industrial applications.
Keywords :
automatic testing; built-in self test; design for testability; error detection; fault diagnosis; integrated circuit modelling; integrated circuit testing; printed circuit testing; BIST; I/sub DDQ/ modelling; board-level test; circuit-level diagnostics; concurrent error detection; design for testability; fault tolerance; industrial applications; synthesis for testability; system-level diagnostics; system-level test; test pattern generation;
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu, Taiwan
Print_ISBN :
0-8186-7478-4
DOI :
10.1109/ATS.1996.555126
