DocumentCode
1611218
Title
Substituting Voas´s testability measure for Musa´s fault exposure ratio
Author
Voas, Jeffrey M. ; Miller, Keith W.
Author_Institution
Reliable Software Technols., Sterling, VA, USA
Volume
1
fYear
1996
Firstpage
230
Abstract
This paper analyzes the relationship between Voas´s (1991) software testability measure and Musa´s (1987) fault exposure ratio, K. It has come to our attention that industrial users of Musa´s model employ his published, experimental value for K, 4.2×10-7, for their projects, instead of creating their own K estimate for the system whose reliability is being assessed. We provide a theoretical argument for how a slight modification to Voas´s formulae for determining a predicted minimal fault size can provide a predicted average fault size. The predicted average fault size can be used as a substitute for 4.2×10-7, and in our opinion is a more plausible choice for K
Keywords
prediction theory; program testing; software reliability; Musa´s fault exposure ratio; Voas´s testability measure; experimental value; predicted average fault size; predicted minimal fault size; software testability measure; system reliability; Application software; Art; Communication industry; Particle measurements; Performance evaluation; Size measurement; Software measurement; Software systems; Software testing; Telecommunications;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications, 1996. ICC '96, Conference Record, Converging Technologies for Tomorrow's Applications. 1996 IEEE International Conference on
Conference_Location
Dallas, TX
Print_ISBN
0-7803-3250-4
Type
conf
DOI
10.1109/ICC.1996.542188
Filename
542188
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