DocumentCode :
1611261
Title :
On test generation for interconnected finite-state machines-the input sequence propagation problem
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear :
1996
Firstpage :
16
Lastpage :
21
Abstract :
Test generation for synchronous sequential circuits can be facilitated by decomposing the circuit into a cycle free interconnection of submachines such that all feedback loops are included within the submachines. We consider a test generation procedure that takes advantage of such a decomposition. The paper focuses on one of the subproblems of the test generation problem, the input sequence propagation problem. The problem occurs when a test sequence T is applied to an embedded machine M´. The fault effects of the target faults of M´ appear on the outputs of M´ and must be propagated through a machine M driven by M´. We propose a solution to the problem of propagating the fault effects of a machine M´ through another machine M. The solution maximizes the number of faults whose fault effects are propagated simultaneously. In this way, the overall test generation time and the test application time are minimized
Keywords :
automatic testing; fault diagnosis; finite state machines; flip-flops; logic testing; sequential circuits; application time; cycle free interconnection; embedded machine; fault effect propagation; feedback loops; generation time; input sequence propagation problem; interconnected finite-state machines; synchronous sequential circuits; test generation; Circuit faults; Circuit testing; Cities and towns; Feedback circuits; Feedback loop; Integrated circuit interconnections; Logic testing; Sequential analysis; Sequential circuits; Synchronous generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu
ISSN :
1085-7735
Print_ISBN :
0-8186-7478-4
Type :
conf
DOI :
10.1109/ATS.1996.555129
Filename :
555129
Link To Document :
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