DocumentCode :
1611432
Title :
Electrical ageing of impregnated polypropylene
Author :
Gosse, B. ; Gosse, J.P. ; Theoleyre, Serge
fYear :
1989
Firstpage :
326
Lastpage :
330
Abstract :
In previous accelerated life testing of liquid-impregnated polypropylene capacitors, it appeared that the breakdown voltage of aged films was significantly lower than that of new films, but only in places (Weibull probability <5%). The causes of such an aging process are still unknown. This problem was investigated by testing model capacitors at high electric stress (150 VRMS/μm) and temperature (80°C) for different aging conditions (liquid conductivity, water content, and additive concentration). The aging of the model capacitors was found to be similar to that of full-size capacitors with respect to the lowering of breakdown voltage and the influence of epoxides. A mechanism other than partial discharges in a gaseous phase at the electrode edges seems to be responsible for the film degradation. No discharges were detected with a tuned circuit; however, tiny electrical discharges, such as those measured at a tip in a liquid but for much higher fields (about 700 V/μm in cyclohexane), may exist in the liquid. It is stressed that the mechanisms may be electrochemical, since degradation is enhanced when aging is performed with a more conductive liquid. Both mechanisms are enhanced by the use of thicker liquid layers. In the first case the liquid film allows discharge growth, and in the second case it supplies with ions at the electrodes the double layers necessary for electrochemical reactions
Keywords :
ageing; composite insulating materials; electric breakdown; filled polymers; insulation testing; polymer films; 80 degC; accelerated life testing; aging process; breakdown voltage; double layers; electric stress; electrical discharges; electrochemical reactions; electrode edges; liquid-impregnated polypropylene capacitors; water content; Accelerated aging; Additives; Capacitors; Conductivity; Degradation; Electrodes; Life estimation; Life testing; Stress; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on
Conference_Location :
Trondheim
Type :
conf
DOI :
10.1109/ICSD.1989.69214
Filename :
69214
Link To Document :
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