DocumentCode :
161151
Title :
PVT-variations-tolerant clock design using self-correcting adjustable delay buffers
Author :
Wen-Pin Tu ; Shih-Hsu Huang ; Hsin-Heng Lu
Author_Institution :
Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
fYear :
2014
fDate :
7-10 May 2014
Firstpage :
1
Lastpage :
2
Abstract :
As the process technology scaling, the tolerance to PVT (process/ voltage/temperature) variation has become a serious concern. During the post-silicon stage, ADBs (adjustable delay buffers) can be used to adjust the delay of the clock path for eliminating the clock skew. However, in fact, unless that the clock tree has a self-correcting mechanism, the clock skew caused by PVT variations still cannot be properly controlled. In this paper, we propose the first self-correcting ADB system to control the clock skew during circuit execution. Experimental results show that our design methodology can achieve very good results.
Keywords :
buffer circuits; clocks; logic design; sequential circuits; PVT-variation-tolerant clock design; circuit execution; clock path delay; clock skew elimination; clock tree; design methodology; first self-correcting ADB system; post-silicon stage; process technology scaling; process-voltage-temperature variation; self-correcting adjustable delay buffers; synchronous sequential circuits; Clocks; Computer architecture; Delays; Detectors; Minimization; Registers; Synchronization; Adjustable Delay Buffer; Clock Skew; PVT Variations; Reliability; Self-Correction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Next-Generation Electronics (ISNE), 2014 International Symposium on
Conference_Location :
Kwei-Shan
Type :
conf
DOI :
10.1109/ISNE.2014.6839357
Filename :
6839357
Link To Document :
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