Multi-function controller for low-power multiple scan test of transition delay faults

Low-power testing is very important in the production process of integrated circuits. In this paper, we design a multifunction controller for a special low-power multiple scan test architecture. The controller can make the multiple scan chains be shifted in segment by segment and only one segment for each scan chain is launched or captured for testing transition delay faults. Either launch-off-shift (LOS) or launch-off-capture (LOC) test application can be performed via the operation of the controller. Only test patterns and simple control signals need to be prepared for testers to achieve the required low-power testing.