DocumentCode :
1611814
Title :
Silicon carbide GTOs: static and dynamic characterization
Author :
Elasser, Ahmed ; Park, John ; Clock, A.W. ; Arthur, Stephen ; Ghezzo, Mario ; Kretchmer, Jim ; Fedison, Jeffrey ; Chow, T.P.
Author_Institution :
GE-Corp. Res. & Dev., Niskayuna, NY, USA
Volume :
1
fYear :
2001
Firstpage :
359
Abstract :
With the continuing improvement in silicon carbide (SiC) materials and processes, power devices such as GTOs and diodes are increasingly being fabricated. Albeit these devices are still in their infancy due to the size of SiC dies, their potential for use in power electronics is tremendous. SiC GTOs can operate at high switching frequencies, high voltages and high junction temperatures. These properties are desirable for a number of applications such as motor drives, high voltage power supplies and high temperature electronics. This paper presents experimental results for 4H-SiC GTOs. Both packaged and unpackaged devices are tested. The GTOs are designed for 1 kV and 3 kV blocking voltage and are capable of handling 5A continuous current. The die size is 1 mm /spl times/1 mm and both involute and concentric designs are explored. Static and dynamic characteristics are presented. A simple boost converter is used to test the GTOs dynamically. A Schottky SiC diode is used as a freewheeling diode. Special attention is given to the behavior of the GTOs both at turn-on and turn-off. Potential applications for these SiC GTOs are also discussed and specific target applications are discussed. In particular, these devices are slated to be used in an all SiC inverters to demonstrate the high voltage, high frequency and high temperature operation of SiC.
Keywords :
power semiconductor switches; semiconductor device measurement; semiconductor device testing; silicon compounds; thyristor convertors; thyristors; 1 kV; 1 mm; 3 kV; 5 A; Schottky SiC diode; SiC; SiC GTOs; applications; boost converter; die size; dynamic characterization; freewheeling diode; inverters; junction temperature; packaged devices; power electronics; semiconductor; static characterization; switching frequency; unpackaged devices; Electronics packaging; Motor drives; Power electronics; Power supplies; Schottky diodes; Silicon carbide; Switching frequency; Temperature; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955443
Filename :
955443
Link To Document :
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