DocumentCode :
1611969
Title :
Hard- and soft-switching buck converter performance of high-voltage 4H-SiC and Si P-i-N diodes
Author :
Trivedi, Malay ; Shenai, Krishna
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
Volume :
1
fYear :
2001
Firstpage :
391
Abstract :
This paper presents a detailed study of the performance of high-voltage Si and 4H-SiC diodes in a DC-DC buck converter. Device operation in hard- and zero-voltage switching conditions is presented with the help of measurements and 2-D finite element simulations. A combination of low excess carrier concentration and low carrier lifetime results in superior switching performance of the 4H-SiC diode over ultra-fast Si diodes. The use of soft switching is shown to minimize the loss and allow operation at higher switching frequencies using Si diodes. The use of soft-switching techniques results in a marginal reduction in power loss of the 4H-SiC diodes. However, the low overall power loss implies that SiC diodes can be used at very high switching frequencies even in hard-switching configurations.
Keywords :
DC-DC power convertors; carrier density; carrier lifetime; elemental semiconductors; finite element analysis; p-i-n diodes; power semiconductor diodes; power semiconductor switches; semiconductor device measurement; semiconductor device models; semiconductor device testing; silicon; silicon compounds; switching circuits; 2-D finite element simulations; 4H-SiC and Si P-i-N diodes; DC-DC buck converter; H-SiC; Si; Si P-i-N diodes; carrier lifetime; excess carrier concentration; hard-switching performance; measurements; power loss; soft-switching performance; switching frequency; zero-voltage switching; Buck converters; Charge carrier lifetime; Finite element methods; P-i-n diodes; Power electronics; Silicon carbide; Switching circuits; Switching frequency; Switching loss; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955450
Filename :
955450
Link To Document :
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