DocumentCode :
1611986
Title :
Electrostatic chuck with a thin ceramic insulation layer for wafer holding
Author :
Yatsuzuka, Kyoko ; Toukairin, Jun-ichi ; Asano, Kazutoshi ; Aonuma, Shinichiro
Author_Institution :
Dept. of Electr. & Inf. Eng., Yamaguchi Univ., Ube, Japan
Volume :
1
fYear :
2001
Firstpage :
399
Abstract :
An electrostatic chuck is one of the useful device holding a thin object flat on a bed by electrostatic force. The authors have investigated the fundamental characteristics of an electrostatic chuck consisted of a pair of comb type electrodes and a thin insulation layer between the electrodes and an object. When a thin polymer film is used as an insulation, the holding force for a wafer was large enough in practical use, while the large residual force remains after removing the DC applied voltage. Thus, it was concluded that AC applied voltage will be more preferable than DC, though the electrostatic force for DC applied voltage is somewhat greater than that for AC voltage. Since the electrostatic chuck is generally used in high temperature atmosphere, for example plasma etching, in the semiconductor industry, the insulating layer must be heat resistant. By using a thin ceramic plate, which was made specially for this purpose, the fundamental characteristics of the electrostatic chuck has been investigated. The greater holding force was obtained with a ceramic plate than that with a polymer film. Furthermore, almost no residual force was observed even for the DC applied voltage. The experimental results are reported both in air and in vacuum condition.
Keywords :
ceramic insulation; electrodes; electrostatic devices; etching; force; semiconductor device manufacture; AC applied voltage; DC applied voltage; comb type electrodes; electrostatic chuck; electrostatic force; fundamental characteristics; holding force; plasma etching; residual force; semiconductor industry; thin ceramic insulation layer; wafer holding; Atmosphere; Ceramics; Electrodes; Electrostatics; Plasma applications; Plasma properties; Plasma temperature; Plastic insulation; Polymer films; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
Conference_Location :
Chicago, IL, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-7114-3
Type :
conf
DOI :
10.1109/IAS.2001.955451
Filename :
955451
Link To Document :
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