• DocumentCode
    1612203
  • Title

    Mechanical motion induced EMI on mobile synchronous generators

  • Author

    Wu, Wei ; Rossetto, Leopoldo

  • Author_Institution
    Dipartimento di Elettronica e Inf., Padova Univ., Italy
  • Volume
    1
  • fYear
    2001
  • Firstpage
    457
  • Abstract
    This paper presents the results of some experimental EMC tests performed on different mobile synchronous generators. These results show that, besides normal EMI generated by rectifying diodes in the field current circuit, additional noise raises from mechanical vibration of electric connection devices and friction between different insulating materials. Further investigations demonstrate that such vibration-derived EMI depends on connectivity of both of inner and outer wire connectors, where load and field currents are flowing. The experiments reveal these additional EMI generating mechanisms by comparing the synchronous generator EMI before and after proper modifications of the power cable connection and layout. Also rubbing different insulating materials can produce static electricity discharge, which results in additional EMI source. Further suggestions for EMI reduction are also discussed.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; friction; machine testing; synchronous generators; vibrations; EMC tests; EMI generating mechanisms; electric connection devices; field currents; insulating materials friction; load currents; mechanical motion-induced EMI; mechanical vibration; mobile synchronous generators; power cable connection; static electricity discharge; vibration-derived EMI; Circuit noise; Circuit testing; Dielectrics and electrical insulation; Diodes; Electromagnetic compatibility; Electromagnetic interference; Noise generators; Performance evaluation; Synchronous generators; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 2001. Thirty-Sixth IAS Annual Meeting. Conference Record of the 2001 IEEE
  • Conference_Location
    Chicago, IL, USA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-7114-3
  • Type

    conf

  • DOI
    10.1109/IAS.2001.955460
  • Filename
    955460