• DocumentCode
    1612290
  • Title

    PSoC dual sensor for pressure and temperature using bipolar junction effects

  • Author

    Muresan, Marius ; Chindris, Gabriel

  • Author_Institution
    Dept. of Appl. Electron., Cluj-Napoca Tech. Univ.
  • fYear
    0
  • Firstpage
    62
  • Lastpage
    66
  • Abstract
    This paper presents theoretical and experimental aspects of the methodology for embedded sensor design with PSoC controllers for measuring the pressure and temperature using two NPN transistors, enlightening the benefits of the method: a PSoC design reduces the time-to-market, increase flexibility, lower part count, provides in-system performance improvement, design security, and field upgrades. Also, another benefit of a PSoC controller is the dynamical re-configuration. The effect of pressure over an emitter-base junction makes a modification of the saturation current, that means a translation of the input characteristic of the emitter-base junction to higher values. The method consists in measuring the temperature and pressure using two transistors and compensates the dependencies between them. This is done by using the same PSoC´s pins and an internal dynamic reconfiguration: one configuration for measuring pressure and one configuration for measuring temperature
  • Keywords
    bipolar digital integrated circuits; integrated circuit design; microcontrollers; p-n junctions; pressure sensors; system-on-chip; temperature sensors; NPN transistors; PSoC controllers; PSoC dual sensor; bipolar junction effects; dynamical reconfiguration; embedded sensor design; emitter-base junction; pressure measurement; pressure sensors; system-on-chip; temperature measurement; temperature sensors; Design methodology; Pins; Pressure control; Pressure measurement; Security; Temperature control; Temperature dependence; Temperature measurement; Temperature sensors; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. 28th International Spring Seminar on
  • Conference_Location
    Wiener Neustadt
  • Print_ISBN
    0-7803-9325-2
  • Type

    conf

  • DOI
    10.1109/ISSE.2005.1491000
  • Filename
    1491000