Title :
Automatic classification of analogue modulation signals by statistical parameters
Author :
Taira, Shintaro ; Murakami, Eiichiro
Author_Institution :
Tech. Res. & Dev. Inst., Japan Defense Agency, Tokyo, Japan
fDate :
6/21/1905 12:00:00 AM
Abstract :
Automatic classification of modulation signals plays an important role in communication applications such as an intelligent demodulator, interference identification and monitoring, so many investigations have been carried out in the past. A new automatic classification procedure of analogue modulation signals including phase continuous FSK signals is proposed. For the discrimination between frequency modulation signals and amplitude modulation signals and the classification among amplitude modulation signals, the statistical parameters of the signal envelope are used. For the classification among frequency modulation signals, the compactness of the instantaneous frequency distribution is used. Good classification possibility have been ascertained by the computer simulations when the SNR⩾10 dB. The discrimination between analogue modulation signals and digital modulation signals based on the block processing is also discussed
Keywords :
amplitude modulation; demodulators; frequency modulation; frequency shift keying; interference (signal); parameter estimation; signal classification; statistical analysis; amplitude modulation signals; analogue modulation signals; automatic classification; block processing; communication applications; computer simulations; digital modulation signals; frequency modulation signals; instantaneous frequency distribution; intelligent demodulator; interference identification; interference monitoring; phase continuous FSK signals; signal envelope; statistical parameters; Amplitude modulation; Computer simulation; Computerized monitoring; Continuous phase modulation; Demodulation; Digital modulation; Frequency modulation; Frequency shift keying; Interference; Signal processing;
Conference_Titel :
Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5538-5
DOI :
10.1109/MILCOM.1999.822672