Title :
Effective Current Enhancement vs. Aspect Ratio for Rectangular Ridge Cathodes
Author :
Miller, R. ; Lau, Y.Y. ; Booske, J.
Author_Institution :
Univ. of Wisconsin, Madison
Abstract :
Summary form given only. In this paper we develop a theoretical model for surface field enhancement and the field emission current obtained from ridged, or "knife-edge" cathodes. As an illustrative example, we consider rectangular cross-section ridges. We use a conformal mapping approach to transform the electric field above a Hat surface to the one surrounding the rectangular ridge. From the exact expression for E(x,y) we derive an analytical scaling law for the local field enhancement factor betaE = |E(x,y)|/Eavg vs. ridge height-to-width aspect ratio at the center and corner of the rectangular ridge. In addition, we calculate the effective enhancement factor, that one would infer from experimental measurements of field emission current versus cathode voltage. Using E(x,y) in the Fowler-Nordheim formula we obtain J(x,v) and numericallv integrate J(x.v) over the surface of the ridge. From Jtotal=A(betaeffEgap)2e(-betaeffEeff) we can find betaeff. Again, we determine the scaling of this eff versus ridge height-to-width aspect ratio and compare it to the scaling of E. Our model can be extended to calculate the field enhancement factor of a composite geometry with multiple protrusions.
Keywords :
cathodes; conformal mapping; aspect ratio; conformal mapping; current enhancement; field emission current; rectangular ridge cathodes; surface field enhancement; Cathodes; Conformal mapping; Current density; Current measurement; Geometry; Laboratories; Power engineering and energy; Solid modeling; USA Councils; Voltage;
Conference_Titel :
Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0915-0
DOI :
10.1109/PPPS.2007.4345442