DocumentCode :
1613090
Title :
Light emission and TRE for a 120 nm technology case study: how much wavelength shift?
Author :
Remmach, M. ; Desplats, R. ; Perdu, P. ; Roux, J.P. ; Vallet, M. ; Dudit, S. ; Sardin, P.
Author_Institution :
French Space Agency, CNES, Toulouse, France
fYear :
2004
Firstpage :
139
Lastpage :
142
Abstract :
After a brief review of light emission in field effect transistors, we extract some electrical and physical parameters linked to the emission of photons such as VDD and channel length. Using 120 nm technology structures (nMOS, pMOS, inverters, etc.) we compare emissions with the following detectors: CCD, MCT for static emission, PICA, SiAPD and SSPD for time resolved photon emission (TRE). Results are interpreted according to the quantum efficiency of detectors as a function of wavelength. Finally, the wavelength shift is addressed by confronting practical results with earlier publications on light emission spectra.
Keywords :
MOSFET; avalanche photodiodes; charge-coupled devices; failure analysis; infrared detectors; integrated circuit testing; luminescence; photodetectors; superconducting photodetectors; time resolved spectra; 120 nm; CCD detectors; IC diagnostic analysis; MCT detectors; PICA detectors; SSPD detectors; Si; SiAPD detectors; TRE; channel length; detector wavelength; electrical parameters; failure analysis; field effect transistors; inverters; light emission; light emission spectra; nMOS structures; nanotechnology structures; pMOS structures; photon emission; physical parameters; picosecond imaging circuit analysis; quantum efficiency; silicon avalanche photodiode; static emission; super-conducting single-element photon detector; time resolved photon emission; wavelength shift; CMOS technology; Computer aided software engineering; Detectors; FETs; Inverters; Luminescence; MOSFET circuits; Photonic integrated circuits; Silicon; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the
Print_ISBN :
0-7803-8454-7
Type :
conf
DOI :
10.1109/IPFA.2004.1345570
Filename :
1345570
Link To Document :
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