• DocumentCode
    1613411
  • Title

    In-situ diagnostic of polypropylene degradation by electrical discharge induced luminescence at room temperature

  • Author

    Duran, Maxime ; Teyssedre, Gilbert ; Massines, Fransoise ; Laurent, Christian

  • Author_Institution
    Lab. de Genie Electr., Univ. Paul Sabatier, Toulouse, France
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    31
  • Lastpage
    34
  • Abstract
    Cold electrical discharges or plasma are widely used to modify polymer properties whereas long interaction can lead to polymer degradation. Discharges are also commonly used to charge dielectric materials in order to study charge storage capabilities of the material and its evolution with time, using as example surface potential measurement. The interest of plasma-induced luminescence (PIL) technique would be to develop a new in-situ diagnostic of discharge-polymer interaction. The aim of the present work is to determine the way a plasma created by a cold electrical discharge can induce polymer luminescence at room temperature and how this PIL can be used for the diagnostic of polymer surface transformations and degradation
  • Keywords
    ESCA; glow discharges; organic insulating materials; photoluminescence; plasma materials processing; polymer films; surface composition; surface discharges; surface treatment; charge storage capabilities; cold electrical discharge; discharge-polymer interaction; in-situ diagnostic; isotactic polypropylene; plasma-induced luminescence; polymer degradation; polymer luminescence; polymer surface transformations; Dielectric materials; Material storage; Plasma diagnostics; Plasma materials processing; Plasma measurements; Plasma properties; Plasma temperature; Polymers; Surface discharges; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2001. ICSD '01. Proceedings of the 2001 IEEE 7th International Conference on
  • Conference_Location
    Eindhoven
  • Print_ISBN
    0-7803-6352-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2001.955504
  • Filename
    955504