Title :
Testing and diagnosis of board interconnects in microprocessor-based systems
Author :
Hsu, Po-Chg ; Wang, Sying-Jyan
Author_Institution :
Holtek Microelectron. Inc., Hsinchu, Taiwan
Abstract :
In this paper we propose a low-cost board-level testing method for printed circuit boards in microprocessor-based systems. The fault detection is achieved by replacing the CPU with a bus emulator to test faults on wiring interconnects. Test patterns are sent by the bus emulator and the results are collected by it later for analysis. We also discuss how to derive minimum test sets for the diagnosis of all modeled faults. Multiple-board systems can be tested by hierarchically applying our method. With this approach, board testing is conducted in a way similar to functional testing while at the same time reach the controllability and observability offered by in-circuit testing
Keywords :
computer testing; fault diagnosis; integrated circuit interconnections; integrated circuit testing; microprocessor chips; printed circuit testing; bus emulator; diagnosis; fault detection; hierarchical testing; microprocessor; multiple-board system; printed circuit board; testing; wiring interconnect; Circuit faults; Circuit testing; Controllability; Electrical fault detection; Fault diagnosis; Integrated circuit interconnections; Pattern analysis; Printed circuits; System testing; Wiring;
Conference_Titel :
Test Symposium, 1996., Proceedings of the Fifth Asian
Conference_Location :
Hsinchu
Print_ISBN :
0-8186-7478-4
DOI :
10.1109/ATS.1996.555137
