• DocumentCode
    1614204
  • Title

    A 4-channel 20-to300 Mpixel/s analog front-end with sampled thermal noise below kT/C for digital SLR cameras

  • Author

    Kapusta, Ronald ; Shinozaki, Hiroto ; Ibaragi, Eitake ; Ni, Kevin ; Wang, Richard ; Sayuk, Mark ; Singer, Larry ; Nakamura, Katsu

  • Author_Institution
    Analog Devices, Wilmington, MA, USA
  • fYear
    2009
  • Firstpage
    42
  • Abstract
    We present a 4-channel analog front-end (AFE) designed specifically for multichannel sensors used in digital single-lens reflex (DSLR) cameras. Multichannel sensors have been adopted as a solution to the increasing requirements for higher throughput in imaging systems. Single-channel AFEs have been published; however, there are drawbacks to using multiple discrete single-channel AFEs in a multichannel system. For example, column readout patterns are particularly sensitive to mismatch between AFE channels. Also, DSLR cameras support many different frame capture modes and read-out patterns, requiring clock rates from below 10MS/s to over 70MS/s, and previous AFEs have not been designed to operate over such a wide range. This paper describes several design techniques developed for the DSLR application, including adaptive power scaling, an integrated reference buffer, and a low-noise sampling technique with sampled thermal noise below kT/C.
  • Keywords
    analogue integrated circuits; cameras; image sensors; thermal noise; DSLR cameras; adaptive power scaling; analog front-end; clock rates; column readout patterns; digital single-lens reflex cameras; frame capture modes; imaging systems; integrated reference buffer; low-noise sampling technique; multichannel sensors; multiple discrete single-channel AFE; sampled thermal noise; Bandwidth; Capacitors; Circuit noise; Crosstalk; Digital cameras; Dynamic range; Noise cancellation; Parasitic capacitance; Sampling methods; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    978-1-4244-3458-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2009.4977298
  • Filename
    4977298